논문 제목: Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation
Journal: npj 2D Materials and Applications Author(s): Kookjin Lee, Sangjin Nam, Hyunjin Ji, Junhee Choi, Jun-Eon Jin, Yeonsu Kim, Junhong Na, Min-Yeul Ryu, Young-Hoon Cho, Hyebin Lee, Jaewoo Lee, Min-Kyu Joo& Gyu-Tae Kim
DOI: https://doi.org/10.1038/s41699-020-00186-w
사사: GAA, EE-MAP |