논문 제목: Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Journal: Adv. Mater. Interfaces Author(s): Kookjin Lee, Hyunjin Ji, Yanghee Kim, Ben Kaczer, Hyebin Lee, Jae-Pyoung Ahn, Junhee Choi, Alexander Grill, Luca Panarella, Quentin Smets, Devin Verreck, Simon Van Beek, Adrian Chasin, Dimitri Linten, Junhong Na, Jae Woo Lee, Ingrid De Wolf, Gyu-Tae Kim
DOI: https://doi.org/10.1002/admi.202102488
사사: EEMAP |