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번호제목작성자날짜조회
62[62-2011] Nano-Needle Transistor-Based Sensors for the Selective Detection of Intracellula.. Level 102011-04-111244
61[61-2011]High yield production of semiconducting p-type single-walled carbon nanotube thin.. Level 102011-03-061210
60[60-2011] Effect of humidity and thermal curing of polymer gate dielectrics on the electri.. Level 102011-03-061192
59[59-2011] Low-frequency noise in junctionless multi-gate transistors [1] Level 102011-03-041395
58[58-2011] White-Light Emitting Diode Array of p+-Si/Aligned n-SnO2 Nanowires Heterojunctio.. [1] Level 102011-02-071331
57[57] Two-Dimensional Produced by Liquid Exfoliation of Layered Materials (2011) [1] file Level 102011-02-051433
56[56-2011] An improved AFM cross-sectional method for piezoelectric nanostructures properti.. [1] Level 102011-02-041274
55[55-2011] A dual analyzer for real-time impedance and noise spectroscopy of nano-scale dev.. [1] file Level 102011-01-211527
54[54-2011]" Highly Sensitive Hydrogen Detection of Catalyst-free ZnO Nanorod Networks Suspe.. [1] Level 102011-01-061345
53[53-2011] Controlled Surface Adsorption of fd Filamentous Phage by Tuning of the pH and th.. [1] Level 102010-12-231272
52[52-2010] Quantitative temperature measurement of an electrically heated carbon nanotube u.. Level 102010-11-031158
51[51] Degradation Pattern of SnO2 Nanowire Field Effect Transistors (2010) file Level 102010-10-241445
50[50-2010] Low-frequency noise in strained SiGe core-shell nanowire p-channel field effect .. [1] Level 102010-07-291496
49[49-2010] Influence of electrical contacts on the 1/ƒ noise in individual multi-walled car.. Level 102010-07-061442
48[48] Suppression of edge effects based on analytic model for leakage current reduction of .. file Level 102010-06-111279
47[47] High Sensitive NO2 Gas Sensor with Low Power Consumption Using Selectively Grown ZnO .. file Level 102010-03-291270
46[46] Effect of gate dielectrics on the device performance of SnO2 nanowire FETs (2010) file Level 102010-03-281392
45[45-2010]Analysis of charge sensitivity and low frequency noise limitation in silicon nano.. [1] Level 102010-02-171335
44[44] Fabrication of oxidation-free contacts to nanopatterned Permalloy structures [1] file Level 102009-12-021383
43[43] Maskless optical microscope lithography system (2009) file Level 102009-11-031285
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